Program/Scientific Program


Time Resolved Spectroscopic Studies with Synchrotron Radiation and Free Electron Laser Sources
Description This MS will cover time resolved spectroscopic techniques at storage rings and FELs. Time-resolved XAFS experiments have taken up momentum at SRs and FELs and now offer time-resolution in the 100 fs time frame, which is of high relevance for many chemical systems.
MS-14 Electronic Structure and Chemical Bond Information by High Energy Resolution X-ray Spectroscopy
Description RIXS and Hard X-ray emission spectroscopy (XES) provides information on the electronic structure that is complementary to X-ray diffraction. It can identify the ligands, determine the chemical state of the metal site and some ligands and is very sensitive to X-ray damage. XES unlike XAS does not require a monochromatic X-ray beam and is thus compatible with a diffraction setup. This property is particularly interesting for crystallography at X-ray free electron lasers. The MS will review the state of the art, introduce the technique, present recent experiments (also at LCLS) and discuss future applications.
MS-38 XAS for Innovation in Industry
Description Application of XAS to solve industrial problems. Industrial relevance with large facilities (synchrotrons and neutrons) Many problems can be solved by use the XAS particularly for chemical industry.
MS-46 XAS of Hydrated Metal Ions and Protein Active Centres in Aqueous Solutions
Description To present the real possibilities and limits of XAS analysis (combined with molecular dynamics, for example) in the study of the solvation structure of metals. This includes inorganic and organometallic metal ions, solvation effects on metalloproteins and high pressure interactions.
MS-64 EXAFS Analysis at the Nanoscale and in Highly Disordered Materials
Description To present the real possibilities and limits of EXAFS analysis at the nanoscale. To date, different papers have mainly addressed the existence of surface effects in terms of the reduction of the number of coordination. This is a controversial issue that needs clarification coupled with the analysis of disorder effects. Finally, what EXAFS (XANES) can really say regarding the existence of vacancies should be also an interesting topic.
MS-103 Spectroscopic Approaches (XAFS, XANES, NMR, ...) in Crystallography
Description Many spectroscopic techniques are naturally complementary with crystallographic methods. Multiple Wavelength Anomalous Dispersion is intrinsically a combined XRD/XAS technique, for example. XAFS and XANES combine to give detailed information on dynamical bonding, dynamical versus static disorder, oxidation and coordination number of active or intermediate states which complement other techniques extremely well. Further, XAFS and XANES combine well with IR to probe detailed molecular dynamics.